验证和调试当今的高速、低压DDR内存接口信号需要探测解决方案，能够从各种各样的形式因素中准确地获取，并提供良好的信号保真度。Tektronix逻辑分析仪探头包含多种连接选项，这些选项的设计目的是确保信号采集是设计性能的真实反映。 关键特性 <0.7 pF总电容负载最小化对电路的干扰 20 kΩ输入电阻 6.5 Vp-p动态范围支持广泛的逻辑族 通用探测允许灵活地连接到工业标准连接 无连接器探测系统无需板载连接器 应用程序 DDR3/DDR4调试和验证 LPDDR调试和验证 嵌入式系统集成、调试和验证 的实时数字系统分析探针解决方案 P6900系列探针 DDR内存接口已经发展到可以在较低电压下支持较高的数据速率，这带来了一些调试和验证方面的挑战。P6900是业界容量的DDR内存应用专用探头，它提供了良好的信号完整性，以确保信号的真实表示——这对于连接到高速内存接口并执行调试和分析至关重要。 对于不同的应用程序，可以使用具有各种附件机制的探针。在电路板空间昂贵的地方，高密度P6960DBL和P6962DBL探头与D-Max®探测技术提供了业界最小的可用空间。对于插入器，P6960HCD、P6960HCD- lv和P6962HCD提供了一个低配置的连接机制，使机械上易于使用插入器。对于低信号摆幅应用，适用于基于D-Max®探测技术的P6960HS。 为了调试高速DDR总线上常见的信号完整性问题，用于DDR应用程序的P6900专用探针与TLA7Bxx模块一起工作，以提供iCapture™同时数字模拟采集。这使您可以清楚地看到与时间相关的数字和模拟行为的设计，没有额外的电容和设置时间的双重探测。 Verification and debug of todays high speed, low voltage DDR Memory interface signals requires probing solutions that can accurately acquire from a wide variety of form factors and provide excellent signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your designs performance. Key features <0.7 pF total capacitive loading minimizes intrusion on circuits 20 kΩ input resistance 6.5 Vp-p dynamic range supports a broad range of logic families General-purpose probing allows flexible attachment to industry- standard connections Connectorless probing system eliminates need for onboard connectors Applications DDR3/DDR4 Debug and Verification LPDDR Debug and Validation Embedded Systems integration, debug, and verification Leading probe solutions for real-time digital systems analysis P6900 series probes The DDR memory interface has evolved to support higher data rates at lower voltages creating several debug and validation challenges. With the industrys lowest capacitance, the P6900 specialty probes for DDR Memory applications offer excellent signal integrity to ensure a true representation of the signal - critical for connecting to high-speed memory interfaces and performing debug and analysis. Probes with a variety of attachment mechanisms for different applications are available. Where circuit board space is at a premium, the high-density P6960DBL and P6962DBL probes with D-Max® Probing Technology offers the industrys smallest available footprint. For use with interposers, the P6960HCD, P6960HCD-LV and P6962HCD offer a low profile connection mechanism making it mechanically easy to use with the interposers. For low signal swing application the P6960HS based on the D-Max® Probing Technology is suitable. For debugging the signal integrity problems common on high-speed DDR buses, the P6900 specialty probes for DDR applications work with the TLA7Bxx modules to provide iCapture™ simultaneous digital-analog acquisition. This allows you to clearly see the time-correlated digital and analog behavior of your design, without the extra capacitance and setup time of double probing.